Three-Dimensional Information on the Phase Domain Structure of Thin Films of Polymer Blends Revealed by Secondary Ion Mass Spectrometry

Macromolecular Rapid Communications ◽

10.1002/1521-3927(20010701)22:11<829::aid-marc829>3.0.co;2-8 ◽

2001 ◽

Vol 22 (11) ◽

pp. 829-834 ◽

Author(s):

Andrzej Bernasik ◽

Jakub Rysz ◽

Andrzej Budkowski ◽

Kazimierz Kowalski ◽

Józef Camra ◽

...

Keyword(s):

Mass Spectrometry ◽

Polymer Blends ◽

Domain Structure ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Phase Domain ◽

Ion Mass Spectrometry ◽

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Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2011.04.018 ◽

2011 ◽

Vol 519 (18) ◽

pp. 6183-6189 ◽

Author(s):

Karl E. Mayerhofer ◽

Jakob Heier ◽

Ylenia Maniglio ◽

Beat Andreas Keller

Keyword(s):

Mass Spectrometry ◽

Dimensional Analysis ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Time Of Flight ◽

Organic Thin Films ◽

Ion Mass Spectrometry ◽

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Tracer Diffusion Coefficients of Li Ions in LixMn2O4 Thin Films Observed by Isotope Exchange Secondary Ion Mass Spectrometry

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.0c06375 ◽

2020 ◽

Vol 124 (42) ◽

pp. 22981-22992

Author(s):

Naoaki Kuwata ◽

Gen Hasegawa ◽

Daiki Maeda ◽

Norikazu Ishigaki ◽

Takamichi Miyazaki ◽

...

Keyword(s):

Mass Spectrometry ◽

Diffusion Coefficients ◽

Isotope Exchange ◽

Secondary Ion Mass Spectrometry ◽

Tracer Diffusion ◽

Ion Mass Spectrometry ◽

Tracer Diffusion Coefficients ◽

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Static secondary ion mass spectrometry analysis of UV photopolymerization in diacetylene thin films

Langmuir ◽

10.1021/la00059a010 ◽

1991 ◽

Vol 7 (11) ◽

pp. 2454-2459 ◽

Author(s):

Paula A. Cornelio-Clark ◽

Joseph A. Gardella

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

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Robust automated three-dimensional segmentation of secondary ion mass spectrometry image sets

Fresenius Journal of Analytical Chemistry ◽

10.1007/s002160051446 ◽

1999 ◽

Vol 365 (1-3) ◽

pp. 63-69 ◽

Author(s):

M. Wolkenstein ◽

T. Stubbings ◽

H. Hutter

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Mass Spectrometry Image ◽

Ion Mass Spectrometry ◽

Three Dimensional Segmentation ◽

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Determination of concentration in depth profiles of thin films with Secondary Ion Mass Spectrometry

Vacuum ◽

10.1016/s0042-207x(76)81117-7 ◽

1976 ◽

Vol 26 (3) ◽

pp. 130

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

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An investigation of cobalt oxide based nanocrystalline thin films by secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.397 ◽

2001 ◽

Vol 15 (17) ◽

pp. 1621-1624 ◽

Author(s):

Simona Barison ◽

Davide Barreca ◽

Sergio Daolio ◽

Monica Fabrizio ◽

Eugenio Tondello

Keyword(s):

Mass Spectrometry ◽

Cobalt Oxide ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Nanocrystalline Thin Films

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Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry

Scientific Reports ◽

10.1038/srep10000 ◽

2015 ◽

Vol 5 (1) ◽

Author(s):

Noritaka Masaki ◽

Itsuko Ishizaki ◽

Takahiro Hayasaka ◽

Gregory L. Fisher ◽

Noriaki Sanada ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Three Dimensional ◽

Time Of Flight ◽

Dimensional Image ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

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Approach for a three-dimensional on-chip quantification by secondary-ion mass spectrometry analysis

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580872 ◽

1997 ◽

Vol 15 (3) ◽

pp. 445-451 ◽

Author(s):

Hubert Gnaser

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Mass Spectrometry Analysis ◽

Spectrometry Analysis ◽

Ion Mass Spectrometry ◽

On Chip ◽

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Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry Imaging of a Pharmaceutical in a Coronary Stent Coating as a Function of Elution Time

Analytical Chemistry ◽

10.1021/ac901587k ◽

2009 ◽

Vol 81 (24) ◽

pp. 9930-9940 ◽

Author(s):

Gregory L. Fisher ◽

Anna M. Belu ◽

Christine M. Mahoney ◽

Klaus Wormuth ◽

Noriaki Sanada

Keyword(s):

Mass Spectrometry ◽

Mass Spectrometry Imaging ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Time Of Flight ◽

Coronary Stent ◽

Elution Time ◽

Ion Mass Spectrometry ◽

Stent Coating ◽

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Nitrogen incorporation and trace element analysis of nanocrystalline diamond thin films by secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.581786 ◽

1999 ◽

Vol 17 (4) ◽

pp. 1135-1140 ◽

Author(s):

D. Zhou ◽

F. A. Stevie ◽

L. Chow ◽

J. McKinley ◽

H. Gnaser ◽

...

Keyword(s):

Mass Spectrometry ◽

Trace Element ◽

Secondary Ion Mass Spectrometry ◽

Trace Element Analysis ◽

Nanocrystalline Diamond ◽

Element Analysis ◽

Nitrogen Incorporation ◽

Ion Mass Spectrometry ◽

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